X-ray fluorescence (XRF) involves bombarding rock material with high energy X-rays. This results in ionization of atoms and emission of radiation.
The raw data comprises a series of wavelets, each one with a unique wavelength of radiation and representing a specific element. Based on ‘peak height’ and ‘area’ of each wavelet, the concentrations of individual elements may be calculated. It is possible to obtain data for c. 43 elements in the range Na-U in the periodic table, with detection levels of c.1ppm achieved for most elements (1wt% oxide = c.10,000ppm).
- The potential to correlate reservoir sections that are problematic using conventional methods due to the depositional setting or thermal degradation/dissolution
- Capable of high resolution stratigraphy and applicable to all lithologies
- Direct implications for provenance, weathering and diagenetic studies
- Used to provide near ‘real-time’ data at wellsite (see Wellsite Chemical Stratigraphy)
Analysis can be performed on wet ditch cuttings, washed and dried ditch cuttings, sidewall core, core or outcrop samples, with all preparations undertaken in our own ‘in-house’ bespoke laboratory. Typically, projects can consist of up to 200 samples per well depending on the interval size and the required level of resolution.